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2D/3D Wafer Metrology System
Industry type: Health and precision instrument
Product model number: 7980
Chroma ATE Inc.
The 7980 wafer measurement system utilizes White Light Interferometry (WLI) for fast, non-destructive, and nanoscale 3D surface profiling, making it ideal for advanced semiconductor packaging. According to 2024 Congruence Market Insight data, WLI technology holds over 45% market share in 3D measurement due to its high resolution and precision.
The 7980 is designed for accurate 2D/3D critical dimension and probe mark measurements. Its self-monitoring QCM function ensures stable and reliable performance. With cutting-edge technology and strong adaptability, the 7980 not only meets current industry demands but is also ready for future high-precision measurement challenges.
Other award winning products for the year (1)
Award winning products in the past (12)
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